According to ITRS 2.0, as the packaging technology improves, Test Time Reduction(TTR) will become more significant in advance IC test.
The main idea of TTR is to reduce test items without losing product quality
腾戈智慧半导体科技 iTanggo
Intelligent Design and Manufacturing
版权© 2024 腾戈智慧半导体科技 iTanggo -保留所有权利。
由 GoDaddy 提供技术支持