GPAT - Spatial Correlation
1.GDBC (Good Die in a Bad Cluster)
-Type A(4) / Type B(8)
-By User Define
-Cut Wafer Edge N Rings
2.Stack / Reticle (by Wafer / Lot)
PPAT - Statistical Outliers
-AEC Standard
-User Define
腾戈智慧半导体科技 iTanggo
Intelligent Design and Manufacturing
版权© 2024 腾戈智慧半导体科技 iTanggo -保留所有权利。
由 GoDaddy 提供技术支持